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Electrochemical and Photoelectrochemical Processing for Oxide Films

Published online by Cambridge University Press:  31 January 2011

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Metal oxides are important materials in industry. For example, there are many kinds of functional oxides: dielectric oxides such as BaTiO3 (perovskite), semiconductor oxides such as ZnO, ionic conductors such as Bi2O3, magnetic oxides such as Fe3−xMxO4 (spinel), and so on. These oxide materials must be prepared as films, nanodots, and layered films to increase their functionality for a wide variety of applications.

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Research Article
Copyright
Copyright © Materials Research Society 2000

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References

1.Yoshimura, M., J. Mater. Res. 13 (4) (1998) p. 796.CrossRefGoogle Scholar
2.Matsumoto, Y., J. Mater. Res. 13 (4) (1998) p. 795.CrossRefGoogle Scholar
3.Heckner, H.N., J. Electroanal. Chem. 44 (1973) p. 9.CrossRefGoogle Scholar
4.Sasaki, T., Matsumoto, Y., Hombo, J., and Ogawa, Y., J. Solid State Chem. 91 (1991) p. 61.CrossRefGoogle Scholar
5.Sasaki, T., Matsumoto, Y., Hombo, J., and Nagata, M., J. Solid State Chem. 105 (1999) p. 255.CrossRefGoogle Scholar
6.Mindt, W., J. Electrochem. Soc. 117 (1970) p. 615.CrossRefGoogle Scholar
7.Mindt, W.. J. Electrochem. Soc. 118 (1971) p. 93.CrossRefGoogle Scholar
8.Matsumoto, Y., Sasaki, T., and Hombo, J., Inorg. Chem. 31 (1992) p. 738.CrossRefGoogle Scholar
9.Matsumoto, Y., Goto, T., and Ohmura, H., J. Electroanal. Chem. 403 (1996) p. 203.CrossRefGoogle Scholar
10.Yoshimura, M., Suchanek, W., Watanabe, T., and Sakurai, B., J. Mater. Res. 13 (4) (1998) p. 875.CrossRefGoogle Scholar
11.Yoshimura, M., in Better Ceramics Through Chemistry V, edited by Hampden-Smith, M.J., Klemperer, W.G., and Brinker, C.J. (Mater. Res. Soc. Symp. Proc. 271, Pittsburgh, 1992) p. 457.Google Scholar
12.Cho, W.S. and Yoshimura, M., Jpn. J. Appl. Phys., Part 1 36 (1997) p. 1216.Google Scholar
13.Matsumoto, Y., Hombo, J., and Qiong, C., J. Electroanal. Chem. 279 (1990) p. 331.CrossRefGoogle Scholar
14.Izaki, M. and Omi, T., J. Electrochem. Soc. 143 (1996) p. L53.CrossRefGoogle Scholar
15.Izaki, M. and Omi, T., J. Electrochem. Soc. 144 (1997) p. 1949.CrossRefGoogle Scholar
16.Izaki, M. and Omi, T., J. Electrochem. Soc. 144 (1997) p. L3.CrossRefGoogle Scholar
17.Mahamuni, S., Borgohain, K., Bedre, B.S., Leppert, V.L., and Risbud, S.H., J. Appl. Phys. 85 (1999) p. 2861.CrossRefGoogle Scholar
18.Pauporte, T. and Lincot, D., Appl. Phys. Lett. 75 (1999) p. 3817.CrossRefGoogle Scholar
19.Matsumoto, Y., Fujisue, M., Sasaki, T., Hombo, J., and Nagata, M., J. Electroanal. Chem. 369 (1994) p. 251.CrossRefGoogle Scholar
20.Matsumoto, Y., Noguchi, M., and Matsunaga, T., J. Phys. Chem. B 103 (1999) p. 7190.CrossRefGoogle Scholar
21.Switzer, J.A., Shumsky, M.G., and Bohannan, E.W., Science 384 (1999) p. 293.CrossRefGoogle Scholar
22.Switzer, J.A., Huang, C.-J., Switzer, E.R., Kammler, D.R., Golden, T.D., and Bohannan, E.W., J. Am. Chem. Soc. 120 (1998) p. 3530.CrossRefGoogle Scholar
23.Switzer, J.A., Shane, M.J., and Phillips, R.J., Science 247 (1990) p. 444.CrossRefGoogle Scholar
24.Switzer, J.A., Raffaelle, R.P., Phillips, R.J., Hung, C.-J., and Golden, T.D., Science 258 (1992) p. 1918.CrossRefGoogle Scholar
25.Switzer, J.A., Hung, C.-J., Breyfogle, B.E., Shumsky, M.G., Van Leeuwen, R., and Goldenz, T.D., Science 264 (1994) p. 1573.CrossRefGoogle Scholar