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Applications of lead-free piezoelectric materials

Published online by Cambridge University Press:  10 August 2018

Kenji Shibata
Affiliation:
SCIOCS Co., Ltd., Japan; shibatak3@sc.sumitomo-chem.co.jp
Ruiping Wang
Affiliation:
National Institute of Advanced Industrial Science and Technology, Japan; rp-wang@aist.go.jp
Tonshaku Tou
Affiliation:
Honda Electronics Co., Ltd., Japan; ttou@honda-el.co.jp
Jurij Koruza
Affiliation:
Technische Universität Darmstadt, Germany; koruza@ceramics.tu-darmstadt.de
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Abstract

The piezoelectric properties of lead-free ferroelectric materials have been dramatically improved over the past two decades. For some limited applications, their properties have reached the same levels or have even surpassed the properties of the benchmark lead-based material Pb(Zr,Ti)O3 (PZT). Initial commercial lead-free products, including powders, ceramic components, films, and devices (e.g., ultrasonic cleaner, knocking sensor), are now available on the market. Several prototype devices, such as inkjet printheads, ultrasonic motors, angular sensors, and energy harvesters, have been developed. Their overall performance is still inferior to that of PZT-based devices; however, these prototypes and products point the way for future applications. Here, we provide an overview of recent industrial developments in the field and discuss the main advantages and disadvantages of lead-free piezoceramics for individual applications.

Type
Lead-free Piezoceramics
Copyright
Copyright © Materials Research Society 2018 

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References

Saito, Y., Takao, H., Tani, T., Nonoyama, T., Takatori, K., Homma, T., Nagaya, T., Nakamura, M., Nature 432, 84 (2004).CrossRefGoogle Scholar
Rödel, J., Webber, K.G., Dittmer, R., Jo, W., Kimura, M., Damjanovic, D., J. Eur. Ceram. Soc. 35, 1659 (2015).CrossRefGoogle Scholar
Koruza, J., Bell, A.J., Frömling, T., Webber, K.G., Wang, K., Rödel, J., J. Materiomics 4, 13 (2018).CrossRefGoogle Scholar
Shimosato, M., Tanuma, C., Toshiba Rev. 67, 45 (2012).Google Scholar
Maruyama, M., “Tokyo Institute of Technology and Konica Minolta Succeeded in Preparing Inkjet Head Using Lead-Free Piezoelectric Ceramics” (in Japanese) Nikkei Technology Online Press release, July 14, 2008, https://tech.nikkeibp.co.jp/dm/article/NEWS/20080714/154755.Google Scholar
Kawada, S., Kimura, M., Higuchi, Y., Takagi, H., Appl. Phys. Express 2, 111401 (2009).CrossRefGoogle Scholar
Kawada, S., Hayashi, H., Ishii, H., Kimura, M., Ando, A., Omiya, S., Kubodera, N., Materials 8, 7423 (2015).CrossRefGoogle Scholar
Liu, C., Liu, P., Kobayashi, K., Randall, C.A., J. Electroceram. 32, 301 (2014).CrossRefGoogle Scholar
Gao, L.S., Ko, S.W., Guo, H.Z., Hennig, E., Randall, C.A., J. Am. Ceram. Soc. 99, 2017 (2016).CrossRefGoogle Scholar
Sapper, E., Gassmann, A., Gjødvad, L., Jo, W., Granzow, T., Rödel, J., J. Eur. Ceram. Soc. 34, 653 (2014).CrossRefGoogle Scholar
Matsuoka, T., Kozuka, H., Kitamura, K., Yamada, H., Kurahashi, T., Yamazaki, M., Ohbayashi, K., J. Appl. Phys. 116, 154104 (2014).CrossRefGoogle Scholar
Ohbayashi, K., Piezoelectric Materials (InTech Open, Vienna, Austria, 2016).Google Scholar
Tou, T., Hamaguti, Y., Maida, Y., Yamamori, H., Takahashi, K., Terashima, Y., Jpn. J. Appl. Phys. 48, 07GM03 (2009).CrossRefGoogle Scholar
Doshida, Y., Kishimoto, S., Ishii, K., Kishi, H., Tamura, H., Tomikawa, Y., Hirose, S., Jpn. J. Appl. Phys. 46, 4921 (2007).CrossRefGoogle Scholar
Doshida, Y., Kishimoto, S., Irieda, T., Tamura, H., Tomikawa, Y., Hirose, S., Jpn. J. Appl. Phys. 47, 4242 (2008).CrossRefGoogle Scholar
Hong, C., Han, H., Lee, J., Wang, K., Yao, F., Li, J., Gwon, J., Quyet, N.V., Jung, J., Jo, W., J. Sens. Sci. Technol. 24 (4), 228 (2015).CrossRefGoogle Scholar
Levassort, F., Grégoire, J.M., Lethiecq, M., Astafiev, K., Nielsen, L., Lou-Moeller, R., Wolny, W.W., IEEE Int. Ultrasonics Symp. (2011), p. 848.Google Scholar
Bantignies, C., Filoux, E., Mauchamp, P., Dufait, R., Thi, M.P., Rouffaud, R., Grégoire, J.M., Levassort, F., IEEE Int. Ultrasonics Symp. (2013), p. 785.Google Scholar
Fujii, E., Takayama, R., Nomura, K., Murata, A., Hirasawa, T., Tomozawa, A., Fujii, S., Kamada, T., Torii, H., IEEE Trans. Ultrason. Ferroelectr. Freq. Control 54, 2431 (2007).CrossRefGoogle Scholar
Nicolas, S., Allain, M., Bridoux, C., Fanget, S., Lesecq, S., Zarudniev, M., Bolis, S., Pouydebasque, A., Jacquet, F., Proc. MEMS 2015 (2015), p. 65.Google Scholar
Saito, T., Wada, T., Adachi, H., Kanno, I., Jpn. J. Appl. Phys. 43, 6627 (2004).CrossRefGoogle Scholar
Nakashima, Y., Sakamoto, W., Maiwa, H., Shimura, T., Yogo, T., Jpn. J. Appl. Phys. 46, L311 (2007).CrossRefGoogle Scholar
Shibata, K., Oka, F., Ohishi, A., Mishima, T., Kanno, I., Appl. Phys. Express 1, 011501 (2008).CrossRefGoogle Scholar
Shibata, K., Suenaga, K., Watanabe, K., Horikiri, F., Nomoto, A., Mishima, T., Jpn. J. Appl. Phys. 50, 041503 (2011).CrossRefGoogle Scholar
Hitachi Metals Ltd., “Succeeded in Developing Triaxial Angular Rate Sensor Using Lead-Free Piezoelectric Thin Film” (in Japanese), http://www.hitachi-metals.co.jp/press/pdf/2014/20141021.pdf. Press release, October 21, 2014.Google Scholar
Le Van, M., Motoaki, H., Fumimasa, H., Kenji, S., Tomoyoshi, M., Hiroki, K., J. Micromech. Microeng. 23, 035029 (2013).Google Scholar
Tsujiura, Y., Suwa, E., Kurokawa, F., Hida, H., Suenaga, K., Shibata, K., Kanno, I., Jpn. J. Appl. Phys. 52, 09KD13 (2013).CrossRefGoogle Scholar
Tanaka, Y., Harigai, T., Ueda, M., Adachi, H., Fujii, E., J. Am. Ceram. Soc. 95, 3547 (2012).CrossRefGoogle Scholar